The World Sees A Chip

We See Its Anatomy

Chip Solutions

Ideation, innovation & validation – a complete circle

Innovators are constantly pushing the limits of design. Manufacturing facilities and OEMs are constantly trying to match their pace. Semiconductor companies are on the lookout for partners capable to work in tandem and end-to-end to realize advanced, production ready chips. As the engineering partner of these innovators, we are pushed to customize our test solutions, develop complex boards and bridge the gap between the simulated world and high volume manufacturing.

Our Capabilities

Mapping our Chip competence

VLSI Design

Test Engineering

Product Engineering

VLSI Design

Driving the semiconductor design arena – Analog, Digital & Mixed Signal

Our design excellence is an enabler to support all phases of the VLSI product life-cycle from conceptualization to product engineering across multiple verticals including Automotive, Computing and Consumer Electronics. We have a well established design flow, excellent process flow and quality compliance system with customized business models that can support customer needs.

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Test Engineering

The apex of testing platform and infrastructure

Supporting major semiconductor companies across five continents for their semiconductor testing and associated engineering solutions, we have developed a competency across multiple testing platforms. In addition, our infrastructure hosts varied setups that meet your every testing need, from bench characterization, reliability testing to failure analysis.

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Product Engineering

Transforming Chips to the next level

Our depth of product engineering and our familiarity with silicon technology enables us to take on complex engineering projects. Right from the design, through the pre-silicon and post-silicon phases, we bring various types of analysis and test measures concerning the wafer, the dashboard, product qualification, etc. These help us to absorb and analyze the enormous amount of data from manufacturing to make meaningful changes to improve yields, reduce test time and increase overall efficiency.

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